Atomic Force Microscopy (AFM) Techniques

Friday, January 27, 2023 at 1:00pm to 5:00pm

MIT Building 8, Bldg 8, Room 110 21 Ames Street, Cambridge, MA 02139

AFM techniques can be broken down into the following general categories: contact, single frequency tapping, multifrequency and 2-pass modes. We will spend 3 afternoons illustrating each case. Piezo force microscopy (PFM) as an example of contact mode, high lateral resolution via higher eigenmodes as an example of single frequency tapping mode, amplitude-modulated, frequency-modulated (AMFM) as an example of a multifrequency technique, and magnetic force microscopy (MFM) and Kelvin probe force microscopy (KPFM) as 2 examples of the 2-pass approach.

Contact: Alan Schwartzman: email:


Event Type

IAP (Independent Activities Period)

Events By Audience

MIT Community

Events By School

School of Engineering (SoE)


AFM techniques

Department of Materials Science and Engineering (DMSE)
Contact Email

Add to my calendar