Atomic Force Microscopy (AFM) Techniques

Friday, January 27, 2023 at 1:00pm to 5:00pm

MIT Building 8, Bldg 8, Room 110 21 Ames Street, Cambridge, MA 02139

AFM techniques can be broken down into the following general categories: contact, single frequency tapping, multifrequency and 2-pass modes. We will spend 3 afternoons illustrating each case. Piezo force microscopy (PFM) as an example of contact mode, high lateral resolution via higher eigenmodes as an example of single frequency tapping mode, amplitude-modulated, frequency-modulated (AMFM) as an example of a multifrequency technique, and magnetic force microscopy (MFM) and Kelvin probe force microscopy (KPFM) as 2 examples of the 2-pass approach.

Contact: Alan Schwartzman: email: alan_s@mit.edu

 

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AFM techniques

Department
Department of Materials Science and Engineering (DMSE)
Contact Email

alan_s@mit.edu

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