Electron microscopy and atomic-scale materials characterization are undergoing a revolution fueled by the new capabilities of electron ptychography, which is setting records for spatial resolution—down to 20 picometers. In this talk, Pinshane Y. Huang from the University of Illinois at Urbana-Champaign will discuss how her group is developing atomically precise methods to characterize materials using electron ptychography and the new science these capabilities enable. Their work spans applications from visualizing thermal vibrations atom-by-atom to recovering 3D atomic coordinates of 2D moiré materials from a single projection.