Strategies for X-ray Structural Analysis introduces diffraction techniques used to elucidate structural properties in powder, bulk polycrystalline, textured and epitaxial thin film materials. The course teaches how to plan experiments for X-ray powder diffraction, grazing-incidence and in-plane XRD for thin-film and surface-sensitive measurements. Students learn to how to interpret high-resolution XRD data, including reciprocal space maps, to characterize lattice strain, defects, and epitaxial quality.